Characterization methods dedicated to nanometer-thick hBN layers

摘要

Hexagonal boron nitride (hBN) regains interest as a strategic component ingraphene engineering and in van der Waals heterostructures built with twodimensional materials. It is crucial then, to handle reliable characterizationtechniques capable to assess the quality of structural and electronicproperties of the hBN material used. We present here characterizationprocedures based on optical spectroscopies, namely cathodoluminescence andRaman, with the additional support of structural analysis conducted bytransmission electron microscopy. We show the capability of opticalspectroscopies to investigate and benchmark the optical and structuralproperties of various hBN thin layers sources.